James, M., Mahoney, M.W., & Waldron, D. (1999, June). Residual stress measurements in friction stir welded aluminum alloys. 1st International Symposium.
James M, Mahoney M W and Waldron D. "Residual stress measurements in friction stir welded aluminum alloys". 1st International Symposium (Jun.1999).
James, M, Mahoney, M W and Waldron, D. "Residual stress measurements in friction stir welded aluminum alloys". 1st International Symposium (Jun.1999).
James M., Mahoney M.W. and Waldron D.Residual stress measurements in friction stir welded aluminum alloys. 1st International Symposium. 1999 Jun; .
James, Mahoney & Waldron 1999, 'Residual stress measurements in friction stir welded aluminum alloys', 1st International Symposium. Available from: https://www.twi-global.com/technical-knowledge/fsw-symposium-papers/FSWSymposia-199906-6Paper02.pdf.
James M, Mahoney MW, Waldron D. Residual stress measurements in friction stir welded aluminum alloys. 1st International Symposium. 1999;. https://www.twi-global.com/technical-knowledge/fsw-symposium-papers/FSWSymposia-199906-6Paper02.pdf.
James MM, Mahoney MW , Waldron DD. Residual stress measurements in friction stir welded aluminum alloys. 1st International Symposium. 1999 Jun;. https://www.twi-global.com/technical-knowledge/fsw-symposium-papers/FSWSymposia-199906-6Paper02.pdf.
Residual stress measurements in friction stir welded aluminum alloys
- James M. ,
- Mahoney M.W. and
- Waldron D.
- James M. ,
- Mahoney M.W. and
- Waldron D.
June 1999
Links
Repository
Description
The surface and near-surface residual stress distributions of friction stir welds in three different aluminium alloys were measured using an x-ray diffraction technique. Welds in very low alkali and hydrogen content Al-Li alloy C458 (Al, 1.73%Li, 2.6%Cu, 0.06%Zn, 0.3%Mn, 0.09%Zr) and in 7050-T7451 and 2219 alloys were studied. Residual stresses were calculated from crystal lattice strain measurements, which were obtained by x-ray diffraction, using beam diameters of 1-3 mm.
1st International Symposium, 14-16 Jun 1999, Session 06: Applications 2, Paper 02
Related Records
